Digital Principles And System Design Set 10

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This set of Digital Principles and System Design Multiple Choice Questions & Answers (MCQs) focuses on Digital Principles And System Design Set 10

Q1 | A user has designed JK flip flop by using the VHDL code. The output is continuously switching between 0 and 1. This condition is known as                
  • switching condition
  • master slave condition
  • race around condition
  • edge triggered condition
Q2 | Which of the following method is not used to remove the race around condition in a flip flop?
  • using level triggered flip flop
  • using master slave flip flop
  • using edge triggered flip flop
  • all of the above are used to remove the race around
Q3 | Which of the following attribute is generally used in implementation of sequential circuits?
  • ‘stable
  • ‘length
  • ‘last_event
  • ‘event
Q4 | Which of the following line is correct for detecting positive edge of a clock?
  • if (clk’event and clk = ‘0’)
  • if (clk’event and clk = ‘1’)
  • if (clk’event or clk = ‘0’)
  • if (clk’event or clk = ‘1’)
Q5 | A user doesn’t want to use the IF statement for detecting clock edge. It is possible to do the same by using any other keyword in VHDL.
  • true
  • false
Q6 | Sequential circuits are represented as
  • finite state machine
  • infinite state machine
  • finite synchronous circuit
  • infinite asynchronous circuit
Q7 | Sequential circuit includes
  • delays
  • feedback
  • delays and feedback from input to output
  • delays and feedback from output to input
Q8 | Which constitutes the test vectors in sequential circuits?
  • feedback variables
  • delay factors
  • test patterns
  • all input combinations
Q9 | Outputs are functions of
  • present state
  • previous state
  • next state
  • present and next state
Q10 | Which is the delay elements for clocked system?
  • and gates
  • or gates
  • flip-flops
  • multiplexers
Q11 | Which contributes to the necessary delay element?
  • flip-flops
  • circuit propagation elements
  • negative feedback path
  • shift registers
Q12 | In an OR gate, if A and B are two inputs and there is struck at 1 fault in B path, then output will be
  • a
  • 0
  • 1
  • b’
Q13 | Iterative test generation method suits for circuits with
  • no feedback loops
  • few feedback loops
  • more feedback loops
  • negative feedback loops only
Q14 | Which method is very time consuming?
  • d-algorithm
  • iterative test generation
  • pseudo exhaustive method
  • test generation pattern
Q15 | In this iterative test generation method, sequential logic is
  • used in the same pattern
  • converted to test logic
  • converted to combinational logic
  • converted to asynchronous logic
Q16 | For a NAND gate, struck-at 1 fault in second input line cannot be detected if
  • q is 1
  • q is 0
  • q changes from 1 to 0
  • q changes from 0 to 1
Q17 | Any condition that causes a processor to stall is called as                    
  • hazard
  • page fault
  • system error
  • none of the mentioned
Q18 | In this technique, a simple fault manifests into multiple N faults.
  • true
  • false
Q19 | The contention for the usage of a hardware device is called              
  • structural hazard
  • stalk
  • deadlock
  • none of the mentioned
Q20 | The situation wherein the data of operands are not available is called              
  • data hazard
  • stock
  • deadlock
  • structural hazard
Q21 | The stalling of the processor due to the unavailability of the instructions is called as
  • control hazard
  • structural hazard
  • input hazard
  • none of the mentioned
Q22 | The time lost due to the branch instruction is often referred to as                          
  • latency
  • delay
  • branch penalty
  • none of the mentioned
Q23 |                          method is used in centralized systems to perform out of order execution.
  • scorecard
  • score boarding
  • optimizing
  • redundancy
Q24 | The algorithm followed in most of the systems to perform out of order execution is                      
  • tomasulo algorithm
  • score carding
  • reader-writer algorithm
  • none of the mentioned
Q25 | The problem where process concurrency becomes an issue is called as                        
  • philosophers problem
  • bakery problem
  • bankers problem
  • reader-writer problem